Satish Chandra

Software Engineer

I obtained my PhD from the University of Wisconsin-Madison in 1997, and a B.Tech. from the Indian Institute of Technology-Kanpur in 1991, both in computer science. From 1997 to 2002, I was a member of technical staff at Bell Laboratories, where my research focused on program analysis, domain-specific languages, and data-communication protocols. From 2002 to 2013, I was a research staff member at IBM Research, where my research focused on bug finding and verification, software synthesis, and test automation. From 2013 to 2016, I worked at Samsung Research America, where I led the advanced programming tools research team. In 2016, I started working at Facebook. I am an ACM Distinguished Scientist.

Recent Items:



Programming Languages, Program Analysis, Software Testing, and Automated Debugging

Latest Publications

ESEC/FSE - November 23, 2020

When Deep Learning Met Code Search

José Cambronero, Hongyu Li, Seohyun Kim, Koushik Sen, Satish Chandra

ICSE - November 23, 2020

Predictive Test Selection

Mateusz Machalica, Alex Samylkin, Meredith Porth, Satish Chandra

ICSE - July 22, 2020

Scaffle: Bug Localization on Millions of Files

Michael Pradel, Vijayaraghavan Murali, Rebecca Qian, Mateusz Machalica, Erik Meijer, Satish Chandra

ICSE - May 21, 2020

Debugging Crashes using Continuous Contrast Set Mining

Rebecca Qian, Yang Yu, Wonhee Park, Vijayaraghavan Murali, Stephen Fink, Satish Chandra

OOPSLA - October 25, 2019

Getafix: Learning to Fix Bugs Automatically

Johannes Bader, Andrew Scott, Michael Pradel, Satish Chandra

arXiv - September 30, 2019

Neural Code Search Evaluation Dataset

Hongyu Li, Seohyun Kim, Satish Chandra

Machine Learning and Programming Languages (MAPL) Workshop at PLDI - June 22, 2019

Neural Query Expansion for Code Search

Jason Liu, Seohyun Kim, Vijayaraghavan Murali, Swarat Chaudhuri, Satish Chandra

Machine Learning and Programming Languages Workshop at ACM SIGPLAN - May 15, 2019

Retrieval on Source Code: A Neural Code Search

Saksham Sachdev, Hongyu Li, Sifei Luan, Seohyun Kim, Koushik Sen, Satish Chandra

ICSE - February 13, 2019

SapFix: Automated End-to-End Repair at Scale

Alexandru Marginean, Johannes Bader, Satish Chandra, Mark Harman, Yue Jia, Ke Mao, Alexander Mols, Andrew Scott